Counter-scanned images

Counter-scanned images (CSI, CSIs)^[1][2][3] are a pair of images obtained during counter-scanning. During the counter-scanning it is possible to obtain one or two pairs of CSIs (see Fig. 1). Each pair consists of a direct image and the image counter to it. First, a conventional image is obtained called the direct image, after that a counter image is obtained by reversing the movement direction along a raster line and the movement direction from line to line of the raster. The direct image of the second pair is formed by the retrace lines of the direct image of the first pair. The counter image of the second pair is formed by the retrace lines of the counter image of the first pair. CSIs are intended for correction of distortions caused by drift of the scanning microscope probe relative to the surface under investigation. To implement correction, it is sufficient to have at least one common feature between the direct and the counter images. As compared to a single CSI pair, the use of two pairs requires twice as much memory and processing time but on the other hand it allows increasing precision of correction and reducing noise level in the corrected image.

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Fig. 1. Counter-scanned images of porous alumina (AFM, 128×128 pixels): (a) direct and (b) counter images of the first pair; (c) direct and (d) counter images of the second pair. Drift induced error makes 25%. (e) Corrected image, residual error makes 0.1%.

See also

• Counter-scanning
• Feature-oriented scanning

References

1. ^ R. V. Lapshin (2007). "Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition" (PDF). Measurement Science and Technology (UK: IOP) 18 (3): 907–927. Bibcode 2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046. ISSN 0957-0233. http://www.nanoworld.org/homepages/lapshin/publications.htm#automatic2007. 
2. ^ R. V. Lapshin (2011). "Feature-oriented scanning probe microscopy". In H. S. Nalwa (PDF). Encyclopedia of Nanoscience and Nanotechnology. 14. USA: American Scientific Publishers. pp. 105–115. ISBN 1-58883-163-9. http://www.nanoworld.org/homepages/lapshin/publications.htm#fospm2011. 
3. ^ V. Y. Yurov, A. N. Klimov (1994). "Scanning tunneling microscope calibration and reconstruction of real image: Drift and slope elimination" (PDF). Review of Scientific Instruments (USA: AIP) 65 (5): 1551–1557. doi:10.1063/1.1144890. ISSN 0034-6748. http://rsi.aip.org/resource/1/rsinak/v65/i5/p1551_s1. 

External links

• Drift elimination based on counter-scanned images, Research section, Lapshin's Personal Page on SPM & Nanotechnology
• Counter-scanned images, Dictionary of Nanotechnological Terms, Russian Corporation of Nanotechnologies