Feature-oriented scanning

Feature-oriented scanning (FOS)^[1][2][3] is a method intended for high-precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the microscope probe. With this method, during successive passings from one surface feature to another one located nearby, the relative distance between the features and the topography of their neighborhoods called surface segments are measured. Such approach permits to scan the required area of the surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method — object-oriented scanning (OOS).

See also

• Counter-scanning
• Feature-oriented positioning

References

1. ^ R. V. Lapshin (2004). "Feature-oriented scanning methodology for probe microscopy and nanotechnology" (PDF). Nanotechnology (UK: IOP) 15 (9): 1135–1151. Bibcode 2004Nanot..15.1135L. doi:10.1088/0957-4484/15/9/006. ISSN 0957-4484. http://www.nanoworld.org/homepages/lapshin/publications.htm#feature2004. 
2. ^ R. V. Lapshin (2007). "Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition" (PDF). Measurement Science and Technology (UK: IOP) 18 (3): 907–927. Bibcode 2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046. ISSN 0957-0233. http://www.nanoworld.org/homepages/lapshin/publications.htm#automatic2007. 
3. ^ R. V. Lapshin (2009). "Availability of feature-oriented scanning probe microscopy for remote-controlled measurements on board a space laboratory or planet exploration rover" (PDF). Astrobiology (USA: Mary Ann Liebert) 9 (5): 437–442. Bibcode 2009AsBio...9..437L. doi:10.1089/ast.2007.0173. ISSN 1531-1074. PMID 19566423. http://www.nanoworld.org/homepages/lapshin/publications.htm#availability2009. 

External links

• Feature-oriented scanning, Research section at Lapshin's Personal Page on SPM & Nanotechnology

This nanotechnology-related article is a stub. You can help Wikipedia by expanding it.v · Categories: Microscopes Scanning atomic-force microscope Scanning probe microscope Nanotechnology Nanotechnology stubs Wikimedia Foundation. 2010. Игры ⚽ Нужен реферат? Rubislaw Church 2007 Amstel Gold Race Look at other dictionaries: Feature-oriented positioning — (FOP)[1][2] is a method of precise movement of the scanning microscope probe across the surface under investigation. With this method, surface features (objects) are used as reference points for microscope probe attachment. Actually, FOP is a… …   Wikipedia Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface …   Wikipedia Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia Counter-scanning — (CS)[1] is a method for measuring surface topography with a scanning probe microscope enabling correction of raster distortions resulted from drift of the microscope probe relative to the surface being measured. Two surface scans, viz. direct… …   Wikipedia Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …   Wikipedia Counter-scanned images — (CSI, CSIs)[1][2][3] are a pair of images obtained during counter scanning. During the counter scanning it is possible to obtain one or two pairs of CSIs (see Fig. 1). Each pair consists of a direct image and the image counter to it. First,… …   Wikipedia Nanotechnology — Part of a series of articles on …   Wikipedia Особенность-ориентированное сканирование — (ООС, англ. FOS – feature oriented scanning)[1][2][3][4] способ прецизионного измерения рельефа поверхности на сканирующем зондовом микроскопе, при котором особенности (объекты) поверхности служат в качестве опорных точек для привязки зонда… …   Википедия Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …   Wikipedia 18+ © Academic, 2000-2024 Contact us: Technical Support, Advertising Dictionaries export, created on PHP, Joomla, Drupal, WordPress, MODx. Mark and share Search through all dictionaries Translate… Search Internet Share the article and excerpts Direct link … Do a right-click on the link above and select “Copy Link”