- Characterization (materials science)
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Characterization, when used in materials science, refers to the use of external techniques to probe into the internal structure and properties of a material. Characterization can take the form of actual materials testing, or analysis, for example in some form of microscope.
Analysis techniques are used simply to magnify the specimen, to visualize its internal structure, and to gain knowledge as to the distribution of elements within the specimen and their interactions.
Magnification and internal visualization are normally done in a type of microscope, such as:
- Optical Microscope
- Scanning Electron Microscope (SEM)
- Transmission Electron Microscope (TEM)
- Field Ion Microscope (FIM)
- Scanning Tunneling Microscope (STM)
- Atomic Force Microscope (AFM)
- X-ray diffraction topography (XRT)
Elemental analysis of the specimen can also be done in a number of ways:
- Energy-Dispersive X-ray spectroscopy (EDX)
- Wavelength Dispersive X-ray spectroscopy (WDX)
- Mass spectrometry
- Impulse excitation technique (IET)
- Secondary Ion Mass Spectrometry (SIMS)
- Electron Energy Loss Spectroscopy (EELS)
- Auger electron spectroscopy
- X-ray photoelectron spectroscopy (XPS)
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