- Field ion microscope
Field ion microscopy (FIM) is an analytical technique used in
materials science . The field ion microscope is a type ofmicroscope that can be used to image the arrangement ofatom s at the surface of a sharp metal tip.It was the first technique by which individual atoms could be spatially resolved. The technique was pioneered byErwin Müller . Images of atomic structures oftungsten were first published in 1951 in the journal "Zeitschrift für Physik".In FIM, a sharp (<50 nm tip radius) metal tip is produced and placed in an
ultra high vacuum chamber, which is backfilled with an imaging gas such ashelium orneon . The tip is cooled to cryogenic temperatures (20–100 K). A positivevoltage of 5000 to 10000volt s is applied to the tip. Gas atoms adsorbed on the tip are ionized by the strongelectric field in the vicinity of the tip (thus, "field ionization"), becoming positively charged and being repelled from the tip. The curvature of the surface near the tip causes a natural magnification —ion s are repelled in a direction roughly perpendicular to the surface (a "point projection" effect). A detector is placed so as to collect these repelled ions; the image formed from all the collected ions can be of sufficient resolution to image individual atoms on the tip surface.Unlike conventional microscopes, where the spatial resolution is limited by the wavelength of the particles which are used for imaging, the FIM is a projection type microscope with atomic resolution and an approximate magnification of a few million times.
ee also
*
Atom probe
*Electron microscope
*Field emission microscope
*List of surface analysis methods External links
* [http://arc.nucapt.northwestern.edu/ Northwestern University Center for Atom-Probe Tomography]
* [http://www.aip.org/png/2006/264.htm Photograph of tungsten needle tip imaged through FIM]
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