Interferometric microscopy

Interferometric microscopy

Interferometric microscopy or Imaging interferometric microscopy is the concept of microscopy whichis related to holography, synthetic-aperture imaging, and off-axis-dark-field illumination techniques.Interferometric microscopy allows enhancement of resolution of optical microscopy due to interferometric (holographic)registration of several partial images (amplitude and phase) and the numerical combining.


=Combining of partial

[
cite journal
url=http://www.opticsexpress.org/abstract.cfm?id=134719
author=Y.Kuznetsova
coauthors=A.Neumann, S.R.Brueck
title=Imaging interferometric microscopy–approaching the linear systems limits of optical resolution
journal=Optics Express
volume=15
pages=6651–6663
year=2007
doi=10.1364/OE.15.006651] ] In interferometric microscopy, the image of a micro-object is synthesized numerically as a coherent combinationof partial images with registered amplitude and phasecite journal
url=http://www.opticsexpress.org/abstract.cfm?id=134719
author=Y.Kuznetsova
coauthors=A.Neumann, S.R.Brueck
title=Imaging interferometric microscopy–approaching the linear systems limits of optical resolution
journal=Optics Express
volume=15
pages=6651–6663
year=2007
doi=10.1364/OE.15.006651] cite journal
url=http://www.ncbi.nlm.nih.gov/sites/entrez?cmd=Retrieve&db=PubMed&list_uids=12943079&dopt=Abstract
author=C.J.Schwarz
coauthors=Y.Kuznetsova and S.R.J.Brueck
title=Imaging interferometric microscopy
journal=Optics Letters
volume=28
pages=1424–1426
year=2003
doi=10.1364/OL.28.001424] For registration of partial images, the conventional holographic set-up is used,with the reference wave, which is usual for the optical holography.The multiple exposition allows the numerical emulation of a large Numerical Aperture objective,at moderate values of the Numerical Aperture of the objective used to register partial imagescite journal
url=http://www.opticsexpress.org/abstract.cfm?id=134719
author=Y.Kuznetsova
coauthors=A.Neumann, S.R.Brueck
title=Imaging interferometric microscopy–approaching the linear systems limits of optical resolution
journal=Optics Express
volume=15
pages=6651–6663
year=2007
doi=10.1364/OE.15.006651] .Similar techniques allows scanning and precise detection of small particles cite journal
url=http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=PLRAAN000073000002021802000001&idtype=cvips&gifs=yes
author=J.Hwang
coauthors=M.M.Fejer, and W.E.Moerner
title= Scanning interferometric microscopy for the detection of ultrasmall phase shifts in condensed matter
journal=PRA
volume= 73
pages=021802
year=2003
doi= 10.1103/PhysRevA.73.021802] .As the combined image keeps both amplitude and phase information, the interferometric microscopy can be especially efficient for the phase objectscite journal
url=http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=PLRAAN000073000002021802000001&idtype=cvips&gifs=yes
author=J.Hwang
coauthors=M.M.Fejer, and W.E.Moerner
title= Scanning interferometric microscopy for the detection of ultrasmall phase shifts in condensed matter
journal=Optik
volume= 115
pages=94–96
year=2004] , allowing detection of light variations of index of refraction, which cause the phase shift or the light passing through for a small fraction of a radian.

Non-optical waves

Although the Interferometric microscopy has been demonstrated only for optical images (visible light), this technics may find application in high resolution atom optics, or optics of neutral atom beams (see Atomic de Broglie microscope), where the Numerical aperture is usually very limitedcite journal
url=http://stacks.iop.org/0953-4075/39/1605
author= D.Kouznetsov
coauthors=H. Oberst, K. Shimizu, A. Neumann, Y. Kuznetsova, J.-F. Bisson, K. Ueda, S. R. J. Brueck
title=Ridged atomic mirrors and atomic nanoscope
journal=JOPB
volume=39
pages=1605–1623
year=2006
doi=10.1088/0953-4075/39/7/005] .

References

ee also

Holography, Numerical Aperture, Diffraction limited


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