Nestor J. Zaluzec

Nestor J. Zaluzec^[1] is an American scientist and inventor who works at Argonne National Laboratory. He invented and patented the Scanning Confocal Electron Microscope.^[2][3][4][5] and the π Steradian Transmission X-ray Detector for Electron-Optical Beam Lines and Microscopes ^[6][7]

A Fellow of both Oak Ridge National Laboratory as well as the Computational Institute of the University of Chicago, Zaluzec , has and continues to hold the tripartite role of Senior Scientist, Educator and Inventor at ANL. As an innovator, his research includes development state-of-the art of instrumentation and techniques for atomic resolution x-ray & electron spectroscopy, and electron microscopy. In addition to creating tools for science, as a researcher he also uses these bleeding edge technologies to study vexing problems in technologically important materials. His work has over the last quarter of a century has included studies in areas of: structural phase transformations in metals, radiation damage in alloys, ceramic oxides for geologic immobilization of nuclear waste materials, elemental segregation in semiconductors devices, to genetically engineered proteins for creation of two dimensional biological templates for magnetic nanoarrays. He was one of the earliest to realized the potential impact of the Internet on science and established the first TelePresence Microscopy Collaboratory,^[8] which has served as a model for outreach to both the scientific and education communities providing unencumbered access to scientific resources. In addition to his roles as an adjunct professor at various Illinois universities, and also to engages the next generation of scientists through his work with the Illinois Junior Academy of Science, where he continues to interacts on a one to one basis with middle and high school students.

Zaluzec has made wide ranging contributions to the field of electron microscopy and microanalysis beginning with his seminal work on quantitative x-ray and electron spectroscopy, which has been disseminated throughout the scientific and academic communities through hundreds invited lectures, short courses and/or seminars at scientific conferences and meetings around the globe. He developed Lorentz STEM imaging, HARECXS, HARECES, Position Resolved Diffraction, as well as his invention of the scanning confocal electron microscope and the π steradian Transmission X-ray Detector, for which he was conferred R&D 100 Awards in 2003 and 2010 respectively.

His professional leadership, includes the Midwest Microscopy and Microanalysis Society^[9] and numerous positions in the Microscopy Society of America to which was elected President in 2009.^[10] He is the receipent of numerous awards from professional societies (the Burton Medal, 2 Distinguished Service Awards, Member of the Year Award, Presidential Citation Award, the Science Digest Award, and two R&D 100 Awards) and has been elected as a Fellow of ORNL , the Microscopy Society of America and the Computational Institute of the University of Chicago.

He established and was the first Director of the Electron Microscopy Center at Argonne National Laboratory,^[11] and has held various Adjunct Professorial Appointments at Illinois Universities (IIT, UIUC, UIC, and NIU) and is a member of 6 professional microscopy societies (MSA, MAS, MSC/SMC, AMMS, EMS, MMMS), and serves on 5 national committees. Zaluzec has also served the professional community of fellow scientists in a number of other ways as a volunteer. For the last two decades, he has operated the Microscopy Listserver^[12] a communication form that links over three thousand microscopists and microanalysts world wide.

References

1. ^ {url=http://www.amc.anl.gov/Docs/ANL/Nestor/NestorVita.html}
2. ^ N.J. Zaluzec, US Patent # 6,548,810, 2003
3. ^ N.J. Zaluzec (2003). "The Scanning Confocal Electron Microscope". Microsc. Today 6: 8. http://www.amc.anl.gov/Docs/ANL/SCEM/MToday-SCEM-Article.pdf. 
4. ^ N.J. Zaluzec (2007). "Scanning Confocal Electron Microscopy". Microsc. Microanal. 13 (S02): 1560. doi:10.1017/S1431927607074004. 
5. ^ S.P. Frigo, Z.H. Levine, N.J. Zaluzec (2002). "Submicron imaging of buried integrated circuit structures using scanning confocal electron microscopy". Appl. Phys. Lett. 81 (11): 2112. doi:10.1063/1.1506010. http://link.aip.org/link/?APPLAB/81/2112/1. 
6. ^ N.J. Zaluzec, US Patent Application # 61,317,847, 2009
7. ^ N.J. Zaluzec (2009). "Innovative Instrumentation for Analysis of Nanoparticles: The π Steradian Detector". Microsc. Today 17 (04): 56–59. doi:10.1017/S1551929509000224. http://www.microscopy-today.com. 
8. ^ {url=http://tpm.amc.anl.gov}
9. ^ {url=http://midwestmicroscopy.org}
10. ^ {url=http://microscopy.org/about/leadership.cfm}
11. ^ {url=http://www.emc.anl.gov}
12. ^ {url=http://www.microscopy.com}

Persondata
Name	Zaluzec, Nestor J.
Alternative names
Short description	Microscopist
Date of birth
Place of birth
Date of death
Place of death