ATE diagnostics

ATE diagnostics

Automatic test equipment (ATE) diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the unit under test is working correctly. The second is when the unit under test is not working correctly, to diagnose the reason. The diagnostic portion can be the most difficult and costly portion of the test. It is typical for ATE to reduce a failure to a cluster or ambiguity group of components. One method to help reduce these ambiguity groups is the addition of analog signature analysis testing to the ATE system. Diagnotics are often aided by the use of flying probe testing.

Typical vendors

* Agilent Technologies
* National Instruments
* Teradyne


Wikimedia Foundation. 2010.

Игры ⚽ Поможем решить контрольную работу

Look at other dictionaries:

  • Analog signature analysis — is electronic component and circuit board troubleshooting technique which applies a current limited AC sinewave across two points of an electronic component or circuit. The resulting current/voltage waveform is shown on a signature display using… …   Wikipedia

  • Flying probe — test systems are often used for only testing basic production, prototypes, and boards that present accessibility problems. Flying probe testing uses electro mechanically controlled probes to access components on printed circuit assemblies (PCAs) …   Wikipedia

  • Automated Tissue Image Systems — (ATIS) are computer controlled automatic test equipment (ATE) systems classified as medical device and used as pathology laboratory tools (tissue based cancer diagnostics) to characterize a stained tissue sample embedded on a bar coded glass… …   Wikipedia

  • Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… …   Wikipedia

  • Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… …   Wikipedia

  • Built-in self-test — A built in self test (BIST)mechanism within an integrated circuit (IC) is a function that verifies all or a portion of the internal functionality of the IC. For example, a BIST mechanism is provided in advanced fieldbus systems to verify… …   Wikipedia

  • cho — ace·tyl·cho·line; ace·tyl·cho·lin·esterase; am·ni·o·cho·ri·on; an·cho·ress; an·cho·rit·ess; an·cho·rit·ic; an·cho·rit·ism; an·cho·veta; an·cho·vy; an·gi·o·cho·li·tis; an·ti·cho·lin·es·ter·ase; ar·cho·plasm; ar·cho·sau·ria; au·tar·cho·glos·sa;… …   English syllables

  • RAST test — A RAST test (short for radioallergosorbent test) is a blood test used to determine what a person is allergic to. This is different from a skin allergy test, which determines allergy by the reaction of a person s skin to different substances. For… …   Wikipedia

  • Nobel Prizes — ▪ 2009 Introduction Prize for Peace       The 2008 Nobel Prize for Peace was awarded to Martti Ahtisaari, former president (1994–2000) of Finland, for his work over more than 30 years in settling international disputes, many involving ethnic,… …   Universalium

  • Relativistic Heavy Ion Collider — Hadron colliders Caption=The Relativistic Heavy Ion Collider at Brookhaven National Laboratory. Some of the superconducting magnets were manufactured by Northrop Grumman Corp. at Bethpage, New York. Note especially the second, independent ring… …   Wikipedia

Share the article and excerpts

Direct link
Do a right-click on the link above
and select “Copy Link”