Bradbury-Nielsen shutter

Bradbury-Nielsen shutter

A Bradbury-Nielsen shutter (or Bradbury-Nielsen gate) is a type of electrical ion gate, which was first proposed in an article by Norris Bradbury and Russel A. Nielsen, where they used it as an electron filter. [cite journal | author = Norris E. Bradbury and Russel A. Nielsen | title = Absolute Values of the Electron Mobility in Hydrogen | year = 1936 | journal = Physical Review | volume = 49 | issue = 5 | pages = 388–93 | doi = 10.1103/PhysRev.49.388] Today they are used in the field of mass spectrometry where they are used in both TOF mass spectrometers and in ion mobility spectrometers, as well as Hadamard transform mass spectrometers (a variant of TOF-MS). [cite journal | author = Joel R. Kimmel, Friedrich Engelke, and Richard N. Zare | title = Novel method for the production of finely spaced Bradbury–Nielson gates | year = 2001 | journal = Review of Scientific Instruments | volume = 72 | issue = 12 | pages = 4354–4357 | doi = 10.1063/1.1416109 ] The Bradbury-Nielsen shutter is ideal for injecting short pulses of ions and can be used to improve the mass resolution of TOF instruments by reducing the initial pulse size as compared to other methods of ion injection.

Theory of Operation

The concept behind the Bradbury-Nielsen shutter is to apply a high frequency voltage in an 180° out-of-phase manner to alternate wires in a grid which is orthogonal to the path of the ion beam. This results in charged particles only passing directly through the shutter at certain times in the voltage phase (φ=nπ). At other times the ion beam is deflected to some angle by the potential difference between the neighboring wires. This deflection is divergent with ions that pass through alternate slits being deflected in opposite directions.

Micromachined ion gates

A Bradbury-Nielsen shutter micromachined from a silicon wafer has been reported.cite journal |author=Zuleta IA, Barbula GK, Robbins MD, Yoon OK, Zare RN |title=Micromachined bradbury-nielsen gates |journal=Anal. Chem. |volume=79 |issue=23 |pages=9160–5 |year=2007 |pmid=17966990 |doi=10.1021/ac071581e]

References

ee also

*Ion mobility spectrometer
*Time-of-flight


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